FIB-SEM (Focused Ion Beam SEM) | High Precision Nano-Analysis
The CIQTEK DB550 is a high-performance Focused Ion Beam SEM (FIB) system that goes beyond traditional electron microscopy by integrating ion beam processing and nano-analysis capabilities
Need a powerful FIB-SEM for your research or manufacturing process? Request a quote today.
DB550 FIB-SEM Microscope Key Features
The DB550 FIB-SEM delivers unparalleled resolution and precision with its integrated ion and electron beam technology, making it an essential tool for nanotechnology research and industrial applications.
- Super Tunnel Electron Optics Technology: Reduces spatial charging effects, enhancing low-voltage imaging performance.
- High-Precision Gallium Ion Beam: Features Ga+ liquid metal ion source with nano fabrication precision down to 3 nm resolution.
- Integrated Nano-Manipulator: Three-axis system with 10 nm stepper motor accuracy for advanced specimen positioning.
- Comprehensive Gas Injection System: Precisely delivers gases for material modification.
- Specimen Exchange Loadlock – Supports up to 8-inch samples, reducing contamination and improving sample handling efficiency.
- Multi-Mode Advanced Imaging Detectors: Includes Everhart-Thornley Detector (ETD), In-Lens Detector, Back-Scattered Electron Detector (BSED), and STEM Detector for versatile material characterization.
- Low-Voltage, High-Resolution Imaging: Optimized for non-conductive and sensitive materials, improving imaging contrast and clarity.
- Cross-Industry Application Versatility: Designed for semiconductors, energy research, materials science, and nanotechnology fabrication.
Looking to compare FIB-SEM microscope models? Contact us for pricing and specifications.
DB550 Focused Ion Beam SEM Performance Advantages
- Unprecedented nano-scale imaging and analysis capabilities
- High-resolution imaging across multiple voltage ranges
- Precise specimen preparation and manipulation
- Reduced spatial charging effects
- Improved lens aberration correction
- Compatibility with various sample types
- All-in-one nano-analysis and fabrication workstation
- Advanced semiconductor failure analysis
- Cross-section observation capabilities
- TEM specimen preparation
Software Capabilities & Accessories
- Integrated user-friendly GUI software
- Specimen characterization tools
- Cross-section analysis software
- Compatibility with multiple signal detection modes
- Micro-nano fabrication support
- Software Development Kit (SDK) available
- Optional image post-processing tools
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Detector Options:
- Everhart-Thornley Detector (ETD)
- In-lens Electron Detector
- Retractable Back-Scattered Electron Detector (BSED)
- Scanning Transmission Electron Microscopy (STEM) Detector
