The Semiconductor application space includes both front-end of line (FEOL) and back-end of line (BEOL) semiconductor production and R&D processes. Much of the production and R&D processes take place while the semiconductor products are still in wafer form. Thus, microscopes capable of handling and inspecting wafers with continuously decreasing feature sizes are essential. Moore’s Law dictates that transistors and one can safely assume all the related parts continuously get smaller so that more speed/computing power can be extracted from these devices.

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