Focused Ion Beam SEM (FIB-SEM)

Full Size Tungsten SEM

Full Size Field Emission SEM

Cold and Hot Sample Mounting

Emspira Digital Microscope

Abrasive Cutters Large Area

Precision Cutters High Volume

Precision Cutters Low Volume

Sensofar S wide Surface Metrology

Sensofar S neox Grand Format Product

Leica K Series of Cameras

Flexacam C5, I5, I5 Integrated

Manual Grinder Polisher Ecomet 30

Semiauto Grinder Polisher Ecomet 30

Semi-Automatic Grinder Polishers

Leica M205 Research Grade Ergonomic Stereo Microscopes

Sensofar S neox

Sensofar S lynx 2

Buehler Vibratory Polisher