EM TXP Sample Targeting Systems

Forensic Comparison Microscopes

Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P

Materials Compound Microscope Leica DM2700 M

Emspira Digital Microscope

Hardness Testing Vickers/Knoop & Brinell

Hardness Testing Rockwell, Universal

Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis

Leica K Series of Cameras

Flexacam C5, I5, I5 Integrated

Sputter Coating Systems

Leica M205 Research Grade Ergonomic Stereo Microscopes

Buehler Vibratory Polisher