Focused Ion Beam SEM (FIB-SEM)

Full Size Tungsten SEM

Full Size Field Emission SEM

EM TXP Sample Targeting Systems

Ergonomic Stereo Microscopes

Sensofar S wide Surface Metrology

Sensofar S neox Grand Format Product

Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis

Leica K Series of Cameras

Flexacam C5, I5, I5 Integrated

Sputter Coating Systems

Sensofar S neox

Sensofar S lynx 2

Buehler Vibratory Polisher

Leica A60 Inspection & Assembly Microscope