Focused Ion Beam SEM (FIB-SEM)

Full Size Tungsten SEM

Full Size Field Emission SEM

EM TXP Sample Targeting Systems

Emspira Digital Microscope

Hardness Testing Vickers/Knoop & Brinell

Hardness Testing Rockwell, Universal

Sensofar S wide Surface Metrology

Sensofar S neox Grand Format Product

Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis

Flexacam C5, I5, I5 Integrated

Sputter Coating Systems

Leica M205 Research Grade Ergonomic Stereo Microscopes

Sensofar S neox

Sensofar S lynx 2

Buehler Vibratory Polisher