X-ray systems for Semiconductor

X-ray Systems for Electronics

X-Ray systems for large area applications

Focused Ion Beam SEM (FIB-SEM)

Full Size Tungsten SEM

X-Ray systems for Battery Technology

Full Size Field Emission SEM

Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P

Materials Compound Microscope Leica DM2700 M

Emspira Digital Microscope

Sensofar S wide Surface Metrology

Sensofar S neox Grand Format Product

Leica K Series of Cameras

Flexacam C5, I5, I5 Integrated

Leica M205 Research Grade Ergonomic Stereo Microscopes

Sensofar S neox

Sensofar S lynx 2