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Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
Full Size Field Emission SEM
Cold and Hot Sample Mounting
EM TXP Sample Targeting Systems
Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P
Materials Compound Microscope Leica DM2700 M
Emspira Digital Microscope
Ergonomic Stereo Microscopes
Abrasive Cutters Large Area
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Hardness Testing Vickers/Knoop & Brinell
Hardness Testing Rockwell, Universal
Sensofar S wide Surface Metrology
Sensofar S neox Grand Format Product
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
Manual Grinder Polisher Ecomet 30
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
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Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
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SEM & Accessories
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