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X-ray systems for Semiconductor
X-ray Systems for Electronics
X-Ray systems for large area applications
Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
X-Ray systems for Battery Technology
Full Size Field Emission SEM
Cold and Hot Sample Mounting
EM TXP Sample Targeting Systems
Fullsize Floor Standing SEM, Coxem CX-200K
Ergonomic Stereo Microscopes
Abrasive Cutters Large Area
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Sensofar S wide Surface Metrology
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Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
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Compound Microscopes Inverted
Education
Forensics
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SEM & Accessories
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