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X-ray systems for Semiconductor
X-ray Systems for Electronics
X-Ray systems for large area applications
Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
X-Ray systems for Battery Technology
Full Size Field Emission SEM
Cold and Hot Sample Mounting
EM TXP Sample Targeting Systems
Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P
Materials Compound Microscope Leica DM2700 M
Ergonomic Stereo Microscopes
Abrasive Cutters Large Area
Precision Cutters High Volume
Precision Cutters Low Volume
Sensofar S wide Surface Metrology
Sensofar S neox Grand Format Product
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
Full-Size SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
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