Skip to content
Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
Full-Size SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
Accessories and Lenses
X-Ray Imaging
Analytical Services
Applications
Microtechnology
Medical Device
Metallography
Material Science
Education
Semiconductor
Sample Preparation for Electron Microscopy
Forensics
Customer Support
Promotions
About Us
About JH
Events
Blogs & Updates
Newsletter
Careers
iFUSE
Shop
Search
Product Search
Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
Full-Size SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
Accessories and Lenses
X-Ray Imaging
Analytical Services
Applications
Microtechnology
Medical Device
Metallography
Material Science
Education
Semiconductor
Sample Preparation for Electron Microscopy
Forensics
Customer Support
Promotions
About Us
About JH
Events
Blogs & Updates
Newsletter
Careers
iFUSE
Shop
Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
Full-Size SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
Accessories and Lenses
X-Ray Imaging
Analytical Services
Applications
Microtechnology
Medical Device
Metallography
Material Science
Education
Semiconductor
Sample Preparation for Electron Microscopy
Forensics
Customer Support
Promotions
About Us
About JH
Events
Blogs & Updates
Newsletter
Careers
iFUSE
Shop
Our Product Line
Sort by :
Default
Newest Arrivals
Filtered (25)
Filters
Reset all
×
Cameras, Software & Lenses
×
Compound Microscopes Inverted
×
Compound Upright Microscopes
×
Electron Microscopy Sample Preparation
×
Ergonomic Research Stereo Microscopes
×
Ergonomic Routine Stereo Microscopes
×
Metrology and 3D Surface Profiling
×
Scanning Electron Microscope
×
X-Ray Imaging
×
Product Categories
Sample Preparation
(
8
)
Metrology and 3D Surface Profiling
(
7
)
Routine Inspection/Assembly Microscopes
(
5
)
Ergonomic Routine Stereo Microscopes
(
4
)
Ergonomic Research Stereo Microscopes
(
4
)
Electron Microscopy Sample Preparation
(
4
)
X-Ray Imaging
(
4
)
Compound Upright Microscopes
(
3
)
Scanning Electron Microscope
(
3
)
Digital Microscope
(
2
)
Hardness Testing
(
2
)
Cameras, Software & Lenses
(
2
)
Compound Microscopes Inverted
(
1
)
Education
(
1
)
Forensics
(
1
)
Stereo Microscope Lighting
(
0
)
Accessories and Lenses
(
0
)
Analytical Services
(
0
)
Show
(
25
)
Cancel
X-ray systems for Semiconductor
X-ray Systems for Electronics
X-Ray systems for large area applications
Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
X-Ray systems for Battery Technology
Full Size Field Emission SEM
EM TXP Sample Targeting Systems
Fullsize Floor Standing SEM, Coxem CX-200K
Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P
Materials Compound Microscope Leica DM2700 M
Ergonomic Stereo Microscopes
Sensofar S wide Surface Metrology
Sensofar S neox Grand Format Product
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
Sputter Coating Systems
Leica M205 Research Grade Ergonomic Stereo Microscopes
Sensofar S neox
« Previous
Page
1
Page
2
Next »
Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
Full-Size SEM
Tabletop & Compact Floor Standing SEM
SEM Software & Hardware
Sample Prep & Cross-sectioning
Hardness Testing
Metrology & 3D Characterization
Cameras, Software & Lenses
Accessories and Lenses
X-Ray Imaging
Analytical Services
Applications
Microtechnology
Medical Device
Metallography
Material Science
Education
Semiconductor
Sample Preparation for Electron Microscopy
Forensics
Customer Support
Promotions
About Us
About JH
Events
Blogs & Updates
Newsletter
Careers
iFUSE
Shop
{"field_798bfda":{"display_mode":"show","fire_action":"All","file_types":"png","logic_data":[{"cfef_logic_field_id":"field_f447988","cfef_logic_field_is":"==","cfef_logic_compare_value":"Yes","_id":"106ced0"}]},"field_94cd4db":{"display_mode":"show","fire_action":"All","file_types":"png","logic_data":[{"cfef_logic_field_id":"field_d910443","cfef_logic_field_is":"==","cfef_logic_compare_value":"Yes","_id":"36b9b61"}]}}
{"field_798bfda":{"display_mode":"show","fire_action":"All","file_types":"png","logic_data":[{"cfef_logic_field_id":"field_f447988","cfef_logic_field_is":"==","cfef_logic_compare_value":"Yes","_id":"106ced0"}]},"field_94cd4db":{"display_mode":"show","fire_action":"All","file_types":"png","logic_data":[{"cfef_logic_field_id":"field_d910443","cfef_logic_field_is":"==","cfef_logic_compare_value":"Yes","_id":"36b9b61"}]}}
Company
First Name
Last Name
Email
Zip Code
Phone
How can we help you?
I would like a price quote?
Yes
No
Enter Product Name
Do you want to Schedule a demo?
Yes
No
Schedule Date
Submit
Schedule Date
Preferred Time
Company
First Name
Last Name
Email
Phone
Description
Submit
Insert/edit link
Close
Enter the destination URL
URL
Link Text
Open link in a new tab
Or link to existing content
Search
No search term specified. Showing recent items.
Search or use up and down arrow keys to select an item.
Cancel
