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Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
Full Size Field Emission SEM
Fullsize Floor Standing SEM, Coxem CX-200K
Automated Materials Compound Microscopes Leica DM4 M/P & DM6 M/P
Materials Compound Microscope Leica DM2700 M
Ergonomic Stereo Microscopes
Sensofar S wide Surface Metrology
Sensofar S neox Grand Format Product
Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
Leica M205 Research Grade Ergonomic Stereo Microscopes
Sensofar S neox
Sensofar S lynx 2
Leica A60 Inspection & Assembly Microscope
Coxem Tabletop Scanning Electron Microscopes
Leica Ivesta Inspection & Assembly Microscope
Product Groups
Microscopes
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SEM & Accessories
Electron Microscopy Sample Preparation
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