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X-ray systems for Semiconductor
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Focused Ion Beam SEM (FIB-SEM)
Full Size Tungsten SEM
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Full Size Field Emission SEM
Cold and Hot Sample Mounting
EM TXP Sample Targeting Systems
Emspira Digital Microscope
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Abrasive Cutters Large Area
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Sensofar S wide Surface Metrology
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Affordable EBSD (Electron Backscatter Diffraction) for Material Analysis
Leica K Series of Cameras
Flexacam C5, I5, I5 Integrated
Manual Grinder Polisher Ecomet 30
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Product Groups
Microscopes
Ergonomic Routine Stereo Microscopes
Routine Inspection/Assembly Microscopes
Ergonomic Research Stereo Microscopes
Stereo Microscope Lighting
Compound Upright Microscopes
Compound Microscopes Inverted
Education
Forensics
Digital
SEM & Accessories
Electron Microscopy Sample Preparation
Full-Size SEM
Tabletop & Compact Floor Standing SEM
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Hardness Testing
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