Metrology & 3D Surface Profiling

In the realms of scientific research, industrial inspection, and quality control, accurate metrology and 3D surface profiling are essential for ensuring precise measurements and comprehensive analysis. We offer advanced metrology and 3D surface profiling capabilities, empowering researchers and professionals to unlock new levels of insight and precision.

Cutting Edge Technology

3D surface metrology is an advanced technique that revolutionizes the way we measure and characterize surface features at the micro- and nano-scale. Whether you’re working with natural or manufactured surfaces, this cutting-edge technology provides unparalleled insight into the intricate details that can significantly impact performance and functionality.

Nano Scale Resolution

With its advanced optical capabilities, 3D surface metrology enables high-resolution mapping of surface features down to the nano-scale. This level of detail is crucial for applications ranging from quality control and material characterization to research and development in fields such as semiconductors, optics, and advanced materials.

Atomic-level Resolution

Atomic Force Microscopes (AFMs) map surfaces at the nanometer scale by detecting interaction forces between a sharp probe and the sample. They provide atomic-level resolution, work on various materials, and enable non-destructive, multi-modal imaging. AFMs are crucial in nanotechnology, materials science, and biology, advancing research in medicine, electronics, and materials engineering.

2D & 3D Metrology

Embracing the latest advancements in non-contact measurement technology, Mitutoyo’s Vision Measuring Systems deliver unparalleled accuracy and repeatability. From complex geometries to intricate surface details, these systems capture high-resolution images and employ advanced algorithms to provide precise dimensional measurements, ensuring stringent quality standards are met.